Announcing the latest in PHI’s line of scanning XPS microprobe instruments – the VersaProbe III. This multi-technique instrument builds on our industry-leading patented scanning microprobe technology and dual beam charge neutralization and takes it to a higher level.
Features of the VersaProbe III:
- New Analyzer input lens with 2-3 times higher sensitivity for all analysis conditions
- New Multi-channel detector for faster elemental and chemical imaging
- New Angle dependent technology for +/- 5 degree solid angle collection for ADXPS measurements
- Improved Hot/cold stage providing temperatures of -140° C to +600° C
- New Dedicated hot sample platen operating up to 800° C
- New 4-contact transferable sample mount for in-situ controlled potential experiments
- New UPS design for increased sensitivity and improved energy resolution
- Improved Auger performance providing higher energy resolution and better signal to noise
Visit the PHI Website
Download the VersaProbe III Product Brochure
