PHI Nano TOF III

PHI Nano TOF III

    A TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis. PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability.

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    PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability. The PHI nanoTOF 3 can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.

    Features:

    • NEW Pulsed Dual-Beam Charge Neutralization For Truly Turn-Key Insulator Analysis
    • NEW Automated Stage & In-Vacuum Parking for High-Throughput Sample Handling & Unattended Analysis
    • NEW Bi Cluster Emitter With Smaller Beam Diameter For Improved High-Throughput HR2 Imaging
    • Tandem Mass Spectrometers For Rapid Imaging And Accurate Peak Identification
    • Confident Chemical & Molecular Analysis Of Curved, Rough & Charging Samples
    • Solutions For In Situ Characterization Of Advanced Materials

    Download the brochure here

    PHI Website link: PHI nanoTOF II TOF-SIMS Surface Analysis Instrument

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