The PHI Genesis is the latest generation of PHI’s highly successful multi-technique XPS product line with PHI’s patented, monochromatic, micro-focused, scanning X-ray source
Features:
- Intuitive Sample Navigation And Confident Analysis Area Identification
- Superior Micro-Area Analysis
- The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available
- Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis
- Optimized Depth Profiling
- Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials
Download the PHI Genesis brochure here
PHI Website link: PHI Genesis (XPS) Surface Analysis Instrument
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