Tag Archives: PHI

Surface Analysis for Broad Range Material Problems

Physical Electronics surface analysis instruments

Physical Electronics (PHI) is the world’s largest supplier of surface analysis instrumentation and the only supplier with a complete product line including; AES, XPS, and TOF-SIMS instruments.  PHI surface analysis instruments are used typically to help accelerate the development of new material systems, evaluate new manufacturing processes and determine the root cause of product defects […]