Surface Analysis for Broad Range Material Problems

Physical Electronics surface analysis instruments

Physical Electronics (PHI) is the world’s largest supplier of surface analysis instrumentation and the only supplier with a complete product line including; AES, XPS, and TOF-SIMS instruments.  PHI surface analysis instruments are used typically to help accelerate the development of new material systems, evaluate new manufacturing processes and determine the root cause of product defects in application areas such as photovoltaics, microelectronics, magnetic media, nanotechnology, metallurgy, tribology, catalyst activity, adhesive bond strength, corrosion resistance, bio-compatibility and printability.

The VersaProbe II is designed to solve a broad range of material problems, using its core technology; PHI’’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance.  New features of the VersaProbe II includes a 128 channel detector, the SmartSoft user interface, and optional 20 kV C60+ and 20 kV Ar2500+ cluster source ion guns for polymer and organic thin film analysis.

Their PHI 700Xi Scanning Auger Nanoprobe for instance is a unique high performance Auger Electron Spectroscopy (AES) system that provides elemental and chemical state information of sample surfaces from nano-scale features, thin films and interfaces.

The Quantera II, PHI’s unique Scanning XPS Microprobe expands the application of X-ray Photoelectron Spectroscopy (XPS) to a broader range of material problems than was possible with previous generation instruments.  The TRIFT V Time-of-Flight Secondary ion Mass Spectrometer is based on a versatile triple focussing mass spectrometer which provides high performance over a broad range of demanding TOF-SIMS applications including: trace metal detection, identification of organic contaminants, imaging of molecular species, and thin film sputter depth profiling.